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1 article(s) from Vaissiere, Nicolas

Cross-sectional Kelvin probe force microscopy on III–V epitaxial multilayer stacks: challenges and perspectives

Mattia da Lisca,
José Alvarez,
James P. Connolly,
Nicolas Vaissiere,
Karim Mekhazni,
Jean Decobert and
Jean-Paul Kleider

Beilstein J. Nanotechnol. 2023, 14, 725–737, doi:10.3762/bjnano.14.59

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Figure 1: Schematic diagram of the KPFM system employed in this analysis. While an ac + dc potential is appli...

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Figure 2: KPFM measurement under ambient conditions on the surface cross section of the sample under dark con...

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Figure 3: (a) Cross-sectional profile at equilibrium of the surface band energies (black: valence band maximu...

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Figure 4: KPFM measurement under ambient conditions on the surface cross section of the sample under illumina...

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Figure 5: SPV profile along the structure calculated from the values of V_CPD/dark and V_CPD/light shown in the...

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Figure 6: Cross-sectional profile at equilibrium of the surface band energies (black: valence band maximum, E_V...

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Figure 7: Cross-sectional profile at equilibrium of the surface band energies (black: valence band maximum, E_V...

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Figure 8: Representation of the energy band profile in a p-type semiconductor under dark conditions and under...

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Published 14 Jun 2023

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